ASSET and Agilent Integrate in-Circuit and JTAG Test

By DE Editors

ASSET InterTech Inc. (Richardson, TX) and Agilent Technologies Inc. (Santa Clara, CA) extended their existing agreement in which ASSET’s ScanWorks JTAG system has been integrated into Agilent’s 3070, Medalist i5000 and the newer i3070 in-circuit test (ICT) systems as the preferred JTAG solution.

The full integration of ScanWorks into Agilent’s ICT platforms allows manufacturers to reduce test costs because boundary-scan tests developed on ScanWorks during design for prototype debug can migrate to ICT systems in high-volume manufacturing lines without additional investment in test development, which represents the only completely integrated JTAG solution available on any ICT system, according to the release.

ASSET InterTech Inc., which is a global company engaged in boundary-scan (JTAG/IEEE 1149.1) test and in-system programming (ISP), will continue as Agilent’s preferred supplier of boundary-scan systems and intellectual property. Agilent offers worldwide support for ScanWorks on the Agilent i3070, 3070 and i5000 ICT systems.

For further information, contact ASSET InterTech, Inc. or Agilent Technologies Inc.

Sources: Press materials received from the company and additional information gleaned from the company’s website.