Cray Selects ASSET’s ScanWorks Platform for Embedded Diagnostics in Next-Generation Supercomputers
Contract calls for two companies to collaborate on embedded test logic.
Latest News
August 20, 2009
By DE Editors
Cray Inc. has selected ASSET InterTech’s ScanWorks platform for embedded instrumentation as the basis for embedded test solutions for Cray’s next-generation of supercomputers. Cray will collaborate with ASSET and ASSET will deliver embedded test logic intellectual property that will support high-reliability and remote diagnostics in Cray’s supercomputers.
“ASSET’s ScanWorks platform provides a rich set of functionality for embedded diagnostics,” said Peg Williams, senior vice president of Research and Development at Cray. “ScanWorks-based solutions will enable Cray’s next-generation product development to maintain a focus on quality and reliability, while continuing to push the envelope in scalability. This is a real differentiator for Cray’s next-generation supercomputers and we believe it will give us a competitive advantage in the marketplace.”
ScanWorks’ embedded IP provides fault isolation in high-availability, mission-critical systems in the computer, telecom, military and aerospace, and storage markets. Its capabilities include single and multi-processor bring-up, remote test, kernel dump, hung system debug, and breakpoints.
For more information, visit ASSET InterTech.
Sources: Press materials received from the company and additional information gleaned from the company’s website.
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