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FARO and Nikon Metrology Settle Patent Litigation

Settlement ends patent dispute dating from 2008.

Settlement ends patent dispute dating from 2008.

FARO Technologies announced that it entered into a settlement agreement with Nikon Metrology (formerly Metris USA) and its affiliates. The settlement agreement resolves the pending patent litigation in the case captioned Metris USA., Inc., et al. v. Faro Technologies, Inc., Civil Action No.: 08-cv-11187 (PBS), together with all related appeals.  The parties to the settlement agreement have agreed to keep the terms of the settlement confidential.

Nikon sued FARO in 2008, alleging the company’s 3D laser scanner manufacturer’s probe accessory infringed on its patents. In 2011, a U.S. District Court Judge issued a summary judgment that FARO did not infringe on the patent; a 2012 jury decision also fell in FARO’s favor.

Nikon then filed a motion to deny FARO’s motion for attorneys’ fees. FARO withdrew its motion for attorneys’ fees prior to settling the case with Nikon.

For more information, visit FARO and Nikon Metrology.

Sources: Press materials received from the company and additional information gleaned from the company’s website.

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