National Instruments Offers DIAdem 11.0

By DE Editors

National Instruments (NI; Austin, TX) released DIAdem 11.0, the latest version in NI’s interactive software for managing,  analyzing, and reporting test data that adds sensor data mapping for 3D CAD models to simplify the visualization of high-channel-count systems. It also streamlines large-group test management with automatic conversion and scaling of engineering unit sets. Plus, NI DataFinder Server Edition 2.0, which works with DIAdem to extend test-data management to large groups or departments,  offers support for user security management and integration with an electronic archiving system.

NI says DIAdem makes it easy to manage, analyze, and report on data collected during data acquisition or generated during simulations, and the software can handle large volumes of data as well as provide consistent reporting and data visualization.

With DIAdem 11.0, users now can map data acquired from sensors to any virtual reality modeling language (VRML) or STL file format in a CAD model to gain a clearer understanding of the measurement or simulation data.

The latest version provides automatic conversion and scaling of engineering unit sets or measurement units to reconcile any geographic or standardization differences that may result from users working in multiple locations. It offers the ability to both expand and limit search parameters for creating more complex data queries. Plus, DIAdem 11.0 provides a script editor that simplifies and accelerates script writing through the use of CodeCompletion for methods and properties of objects as well as syntax highlighting, says the company.

With NI DataFinder Server Edition, engineers can access collected test data from multiple client computers. The latest version of the software adds support for user security management, which synchronizes users’ defined security rights with their Microsoft Windows login for easier and more secure access. NI DataFinder Server Edition 2.0 also adds integration with electronic archiving systems for easily and quickly indexing and searching archived files.

Readers can visit National Instruments to view DIAdem demonstrations, tutorials, and case studies.

Sources: Press materials received from the company and additional information gleaned from the company’s website.