November 1, 2016
Tektronix has launched two new test solutions that are focused on helping engineers achieve standardization and compliance: The ONFI standard and a Type-C Transmitter Test Solution.
The ONFI standard is published by the ONFI Working Group to simplify the integration of NAND Flash memory into consumer electronics and computing platforms. The ONFI 4.0 spec introduces the evolutionary NV-DDR3 interface with VccQ = 1.2V operation for increased performance and improved power consumption, scales NV-DDR2 and NV-DDR3 I/O speed to 667 MT/s and 800 MT/s, and adds ZQ calibration functionality, Tektronix states.
The DisplayPort Type-C Transmitter Test solution integrates support for the Type-C specification, and includes automated test setup and timer pop-ups for hands-free testing. This release also integrates the DPOJET measurement library for helping characterize silicon and debugging.
“For engineers facing pressure to bring new designs to market on schedule and on budget, saving time during test and measurement can be an important factor in their ultimate success,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “With this solution, we are giving our customers working on DisplayPort designs time back in their day. They can now simply select the test they want to run and work on other tasks while the tests are running.”
For more information, visit Tektronix.
Sources: Press materials received from the company and additional information gleaned from the company’s website.
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