Tektronix Offers Procedure for SATA Revision 3.0 Physical Layer Tests

By DE Editors

Tektronix, Inc. (Beaverton, OR) announced its first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.

View complete Methods of Implementation (MOI) for SATA Gen1 and Gen2 standards as well as the new test guide for Serial ATA Revision 3.0.

The third-generation specification for the Serial ATA storage interface will double the maximum transfer speed from 3Gbps to 6Gbps, paving the way to higher performance storage solutions including emerging solid state drives and enterprise business storage needs. SATA 6Gbps technology will enable large amounts of data to be moved at even faster rates, a key advantage as end-users amass ever-increasing amounts of high-resolution photos, videos, music, and other multimedia files.

Tektronix provides capabilities for physical-layer testing of high-speed serial data technologies, including SATA 6Gbps. For example, the Tektronix AWG7000B Arbitrary Waveform Generator series with its fine resolution sequencer is able to interact with complex state machines for link state training of 6Gbps hosts and disks. Plus, the Tektronix DSA/DPO70000 oscilloscope series provide the only multi-channel models on the market that can acquire 6Gbps transmitted signals at or above the 5th harmonic, enabling greater margin and fidelity for demanding compliance and debug testing.

For details, contact Tektronix.

Sources:  Press materials received from the company and additional information gleaned from the company’s website.